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Characterization
Characterization is a broad term that is used to describe any method of analysis of properties of materials and devices. The various tools listed here will use different techniques to study a wide variety of properties.
Equipment name & Badger ID |
Location | Image | Overview | Link to Training |
|---|---|---|---|---|
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AFM-Asylum afm-asylum |
SNF Exfab Paul G Allen 151 Ocean |
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Asylum AFM MFP-3D is a fully-featured atomic force microscopy system. It can accommodate a variety of small-to-medium size samples that do not exceed ~5-6 mm in height. The microscope is...Read more |
AFM-Asylum Training |
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Alphastep 500 Profilometer alphastep |
SNF Cleanroom Paul G Allen L107 |
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The Tencor Alphastep 500 is a stylus-based surface profiler to measure step heights of surfaces. A stylus is placed in contact with, and then gently dragged along the surface of...Read more |
Alphastep 500 Profilometer Training |
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Biologic SP-300 biologic |
SNF Exfab Paul G Allen 155 Mavericks |
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The Biologic Poteniostat can be used for: - Renewable energy sources - Fundamental electrochemistry - Sensors - Corrosion - Electrolysis/anodizing - Coatings Our system has - Ultra low current: range...Read more |
Bio-Logic Potentiostat Training |
| Bruker Dimension ICON AFM | Dimension ICON is one of the most popular modern AFMs on the market, highly appreciated by industry and academics alike. It is Bruker’s flagship AFM instrument, compatible with all modes...Read more | Bruker Dimension ICON AFM Training | ||
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CytoViva HSI cytoviva |
SNF Exfab Paul G Allen 151 Ocean |
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The Cytoviva is a hyperspectral imaging instrument which allows spectral mapping of individual pixels on a microscope image. The Cytoviva website has great information about the instrument including ...Read more |
Cytoviva Training |
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Digital Instruments AFM Nanoscope Dimension 3000 afm2 |
SNF Exfab Paul G Allen 104 Stinson |
Digital Instruments AFM Nanoscope Dimension 3000: * Atomic Force and scanning tunneling scanning modes: contact, tapping, non-contact, liftmode, force modulation, lateral force microscopy, magnetic force microscopy, phase imaging, scanning capacitance,...Read more |
Digital Instruments AFM Nanoscope Dimension 3000 Training | |
| DLS: Brookhaven Instrument Nanobrook Omni | SMF Shriram 099 |
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Dynamic Light Scattering (also known as Photon Correlation Spectroscopy or Quasi-Elastic Light Scattering) is a technique to determine the size distribution profile of small particles in suspension or polymers in...Read more |
SMF Training |
| FEI Titan Environmental Transmission Electron Microscope (TEM) |
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The Stanford Nano Shared Facilities houses a state-of-the-art FEI 80-300 environmental (scanning) transmission electron microscope with the following capabilities: Accelerating voltages 80, 200 and 300 kV High brightness field emission...Read more | Titan TEM Training | |
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Flexus 2320 Stress Tester stresstest |
SNF Cleanroom Paul G Allen L107 |
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The Flexus 2320 determines wafer curvature by measuring the angle of deflection of a laser beam off the surface of the substrate. Film stress is determined by comparing the change...Read more |
Flexus 2320 Stress Tester Training |
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Jasco UV-Vis-NIR jasco-uv-vis-nir |
SNF Exfab Paul G Allen 151 Ocean |
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(From the Jasco website) The unique single monochromator design of the V-670 requires fewer mirrors to provide a higher throughput resulting in a better signal-to-noise ratio over the...Read more |
Jasco UV-Vis-NIR Training |
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Keyence Digital Microscope VHX-6000 keyence |
SNF Exfab Paul G Allen 104 Stinson | Keyence Training | ||
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Lakeshore Hall Measurement System LakeshoreHall |
SNF Exfab Paul G Allen 151 Ocean |
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The Lakeshore 8404 Hall measurement tool is installed in Allen 151 at SNF and we have demonstrated the functionality by AlGaN/GaN HEMT, diamond and 2D material samples. The capability of this tool:
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Lakeshore Hall Measurement System training |
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LEI1500 Contactless Sheet Resistance Mapping eddycurrent |
SNF Exfab Paul G Allen 151 Ocean |
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The LEI1500 Eddy current system measures sheet conductance (mhos/square) as a proportional DC voltage, before and after moving the sample under the sensing coil with magnetic field. This allows contactless measurement of...Read more |
LEI1500 Contactless Sheet Resistance Mapping Training |
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Malvern Dynamic Light Scattering (DLS) Zetasizer malvern-dls |
SNF Exfab Paul G Allen 155 Mavericks |
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The Malvern Zetasizer Nano ZSP uses light scattering to evaluate nanoparticle sizes from 0.3 nm to 10 um in diameter. This system is also equipped with the capability to evaluate...Read more |
Malvern Dynamic Light Scattering (DLS) Zetasizer Training |
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micromanipulator6000 IV-CV probe station micromanipulator6000 |
SNF Exfab Paul G Allen 151 Ocean |
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Micromanipulator6000
Micromanipulator6000 is a four-probe electrical test station. With a Keysight B1500A Semiconductor Device Analyzer, it is capable of both I-V and C-V measurements. What the Tool CAN do...Read more |
micromanipulator6000 IV-CV probe station Training |
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Nanospec 210XP nanospec2 |
SNF Exfab Paul G Allen 104 Stinson |
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The Nanometrics Nanospec 210XP system uses non-contact, spectro-reflectometry (measurement of the intensity of reflective light as a function of incident wavelength) to determine the thickness of transparent films (up to...Read more |
Nanospec Training |
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Nanospec 3 nanospec3 |
SNF Cleanroom Paul G Allen L107 |
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The Nanometrics Nanospec system uses non-contact, spectro-reflectometry (measurement of the intensity of reflective light as a function of incident wavelength) to determine the thickness of transparent films (up to two)...Read more |
Nanospec 3 Training |
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Park XE-70 XE-70_snl |
![[Photo: Park AFM]](https://snfexfab.stanford.edu/sites/g/files/sbiybj8726/f/styles/page-width/public/spm_park_01.jpg?itok=qZeJGOCQ) |
Scanning Probe Microscopy (SPM) generally refers to a set of surface characterization techniques that utilize micro-machined cantilever probes with sharp tips to scan the sample surface. Since its inception in...Read more | Park XE-70 Training | |
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Prometrix Resistivity Mapping System prometrix |
SNF Cleanroom Paul G Allen L107 |
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The Prometrix OmniMap Model RS35e Resistivity Mapping System collects and analyzes sheet resistance data on various conductive layers such as implants, diffusions, epi, metals and bulk substrates. The system provides...Read more |
Prometrix Training |
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Reflectance Spectrometer Filmetrics F40 filmetrics |
SNF Cleanroom Paul G Allen L107 | Reflectance Spectrometer Filmetrics F40 Training |
