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Characterization

Characterization is a broad term that is used to describe any method of analysis of properties of materials and devices. The various tools listed here will use different techniques to study a wide variety of properties.

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Equipment name & Badger IDsort descending Location Image Overview Link to Training
AFM-Asylum
afm-asylum
SNF Exfab Paul G Allen 151 Ocean
Asylum AFM

Asylum AFM MFP-3D is a fully-featured atomic force microscopy system. It can accommodate a variety of small-to-medium size samples that do not exceed ~5-6 mm in height. The microscope is...Read more

AFM-Asylum Training
Alphastep 500 Profilometer
alphastep
SNF Cleanroom Paul G Allen L107

The Tencor Alphastep 500 is a stylus-based surface profiler to measure step heights of surfaces. A stylus is placed in contact with, and then gently dragged along the surface of...Read more

Alphastep 500 Profilometer Training
Biologic SP-300
biologic
SNF Exfab Paul G Allen 155 Mavericks
Photo of Biologic Potentiostat

The Biologic Poteniostat can be used for: - Renewable energy sources - Fundamental electrochemistry - Sensors - Corrosion - Electrolysis/anodizing - Coatings Our system has - Ultra low current: range...Read more

Bio-Logic Potentiostat Training
Bruker Dimension ICON AFM Dimension ICON is one of the most popular modern AFMs on the market, highly appreciated by industry and academics alike. It is Bruker’s flagship AFM instrument, compatible with all modes...Read more Bruker Dimension ICON AFM Training
CytoViva HSI
cytoviva
SNF Exfab Paul G Allen 151 Ocean

The Cytoviva is a hyperspectral imaging instrument which allows spectral mapping of individual pixels on a microscope image.

The Cytoviva website has great information about the instrument including ...Read more

Cytoviva Training
Digital Instruments AFM Nanoscope Dimension 3000
afm2
SNF Exfab Paul G Allen 104 Stinson

Digital Instruments AFM Nanoscope Dimension 3000: * Atomic Force and scanning tunneling scanning modes: contact, tapping, non-contact, liftmode, force modulation, lateral force microscopy, magnetic force microscopy, phase imaging, scanning capacitance,...Read more

Digital Instruments AFM Nanoscope Dimension 3000 Training
DLS: Brookhaven Instrument Nanobrook Omni SMF Shriram 099

Dynamic Light Scattering (also known as Photon Correlation Spectroscopy or Quasi-Elastic Light Scattering) is a technique to determine the size distribution profile of small particles in suspension or polymers in...Read more

SMF Training
FEI Titan Environmental Transmission Electron Microscope (TEM)
The Stanford Nano Shared Facilities houses a state-of-the-art FEI 80-300 environmental (scanning) transmission electron microscope with the following capabilities: Accelerating voltages 80, 200 and 300 kV High brightness field emission...Read more Titan TEM Training
Flexus 2320 Stress Tester
stresstest
SNF Cleanroom Paul G Allen L107

The Flexus 2320 determines wafer curvature by measuring the angle of deflection of a laser beam off the surface of the substrate. Film stress is determined by comparing the change...Read more

Flexus 2320 Stress Tester Training
Jasco UV-Vis-NIR
jasco-uv-vis-nir
SNF Exfab Paul G Allen 151 Ocean

(From the Jasco website)

The unique single monochromator design of the V-670 requires fewer mirrors to provide a higher throughput resulting in a better signal-to-noise ratio over the...Read more

Jasco UV-Vis-NIR Training
Keyence Digital Microscope VHX-6000
keyence
SNF Exfab Paul G Allen 104 Stinson Keyence Training
Lakeshore Hall Measurement System
LakeshoreHall
SNF Exfab Paul G Allen 151 Ocean
The Lakeshore 8404 Hall measurement tool is installed in Allen 151 at SNF and we have demonstrated the functionality by AlGaN/GaN HEMT, diamond and 2D material samples. The capability of this tool:
  • Ideal
...Read more
Lakeshore Hall Measurement System training
LEI1500 Contactless Sheet Resistance Mapping
eddycurrent
SNF Exfab Paul G Allen 151 Ocean

The LEI1500 Eddy current system measures sheet conductance (mhos/square) as a proportional DC voltage, before and after moving the sample under the sensing coil with magnetic field. This allows contactless measurement of...Read more

LEI1500 Contactless Sheet Resistance Mapping Training
Malvern Dynamic Light Scattering (DLS) Zetasizer
malvern-dls
SNF Exfab Paul G Allen 155 Mavericks

The Malvern Zetasizer Nano ZSP uses light scattering to evaluate nanoparticle sizes from 0.3 nm to 10 um in diameter. This system is also equipped with the capability to evaluate...Read more

Malvern Dynamic Light Scattering (DLS) Zetasizer Training
micromanipulator6000 IV-CV probe station
micromanipulator6000
SNF Exfab Paul G Allen 151 Ocean

Micromanipulator6000

 

Micromanipulator6000 is a four-probe electrical test station. With a Keysight B1500A Semiconductor Device Analyzer, it is capable of both I-V and C-V measurements.

What the Tool CAN do...Read more

micromanipulator6000 IV-CV probe station Training
Nanospec 210XP
nanospec2
SNF Exfab Paul G Allen 104 Stinson

The Nanometrics Nanospec 210XP system uses non-contact, spectro-reflectometry (measurement of the intensity of reflective light as a function of incident wavelength) to determine the thickness of transparent films (up to...Read more

Nanospec Training
Nanospec 3
nanospec3
SNF Cleanroom Paul G Allen L107

The Nanometrics Nanospec system uses non-contact, spectro-reflectometry (measurement of the intensity of reflective light as a function of incident wavelength) to determine the thickness of transparent films (up to two)...Read more

Nanospec 3 Training
Park XE-70
XE-70_snl
[Photo: Park AFM]
Scanning Probe Microscopy (SPM) generally refers to a set of surface characterization techniques that utilize micro-machined cantilever probes with sharp tips to scan the sample surface.  Since its inception in...Read more Park XE-70 Training
Prometrix Resistivity Mapping System
prometrix
SNF Cleanroom Paul G Allen L107

The Prometrix OmniMap Model RS35e Resistivity Mapping System collects and analyzes sheet resistance data on various conductive layers such as implants, diffusions, epi, metals and bulk substrates. The system provides...Read more

Prometrix Training
Reflectance Spectrometer Filmetrics F40
filmetrics
SNF Cleanroom Paul G Allen L107 Reflectance Spectrometer Filmetrics F40 Training

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