SNF is open under New Normal Rules. ANY shadowing must be coordinated with SNF staff first.
Atomic Force Microscopy (AFM)
| Equipment name & Badger ID | Location | Image | Overview | Link to Training |
|---|---|---|---|---|
|
AFM-Asylum afm-asylum |
SNF Exfab Paul G Allen 151 Ocean |
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Asylum AFM MFP-3D is a fully-featured atomic force microscopy system. It can accommodate a variety of small-to-medium size samples that do not exceed ~5-6 mm in height. The microscope is...Read more |
AFM-Asylum Training |
| Bruker Dimension ICON AFM | Dimension ICON is one of the most popular modern AFMs on the market, highly appreciated by industry and academics alike. It is Bruker’s flagship AFM instrument, compatible with all modes...Read more | Bruker Dimension ICON AFM Training | ||
|
Digital Instruments AFM Nanoscope Dimension 3000 afm2 |
SNF Exfab Paul G Allen 104 Stinson |
Digital Instruments AFM Nanoscope Dimension 3000: * Atomic Force and scanning tunneling scanning modes: contact, tapping, non-contact, liftmode, force modulation, lateral force microscopy, magnetic force microscopy, phase imaging, scanning capacitance,...Read more |
Digital Instruments AFM Nanoscope Dimension 3000 Training | |
|
Park XE-70 XE-70_snl |
![[Photo: Park AFM]](https://snfexfab.stanford.edu/sites/g/files/sbiybj8726/f/styles/page-width/public/spm_park_01.jpg?itok=qZeJGOCQ) |
Scanning Probe Microscopy (SPM) generally refers to a set of surface characterization techniques that utilize micro-machined cantilever probes with sharp tips to scan the sample surface. Since its inception in...Read more | Park XE-70 Training |
