Skip to content Skip to navigation

STSetch2 Profile Characterization- Undercut Investigation for Silicon Trench Etching in STSetch2

Project Type: 
E241
Date: 
December 2010
Areas of Interest: 
STSetch2 Profile Characterization
Function and Method: 
Dry Etching
Researchers and (Mentors): 
Lele Wang, Dong Liang, Yu-Shuen Wang, (Jim McVittie)
Report(s): 
STSetch2 Profile Characterization - Undercut Investigation for Silicon Trench Etching in STSetch2- Final Report