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X-Ray & Surface Analysis

At the core of the XSA facilities in the McCullough and Spilker buildings are X-ray Diffraction (XRD), X-ray Photoelectron Spectroscopy (XPS), NanoSIMS and a range of other Scanning Probe Micoscopy capabilites.

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Equipment name & Badger IDsort descending Location Image Overview Link to Training
XPS: PHI VersaProbe 1
PHI_XPS_snl
SNSF McCullough 102
XPS: PHI Versaprobe 1
XPS provides elemental and chemical information about the surface region (first 1- 30 monolayers) of nearly any solid material. XPS is useful for determining the elemental composition on the surface...Read more XPS PHI VersaProbe Training
XPS: PHI VersaProbe 3 SNSF McCullough 102
XPS provides elemental and chemical information about the surface region (first 1- 30 monolayers) of nearly any solid material. XPS is useful for determining the elemental composition on the surface...Read more XPS PHI VersaProbe Training

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