Sinton lifetime tester WCT-100 is used to test minority carrier lifetime at a specified minority carrier density. Electrons are the usual minority carries in a p-doped semiconductor and holes are the usual minority carriers in n-doped semiconductors. Minority carrier lifetime is the average time that the minority carrier spends in a semiconductor from generation to recombination.
Links
[1] https://snfguide.stanford.edu/snf/cleanliness/flexible
[2] https://snfguide.stanford.edu/guide/lab-organization-facility/snf
[3] https://snfguide.stanford.edu/guide/people/swaroop-kommera
[4] https://snfguide.stanford.edu/guide/people/jim-haydon
[5] https://snfguide.stanford.edu/forwards-to-snf-was-how-to-join-snf
[6] https://snfguide.stanford.edu/guide/locations/snf-exfab-paul-g-allen-151-ocean
[7] https://snfguide.stanford.edu/snf/badger-area/nsil-151-ocean
[8] https://snfguide.stanford.edu/snf/substrate-size/pieces
[9] https://snfguide.stanford.edu/guide/substrate-size/2-inch-wafer
[10] https://snfguide.stanford.edu/guide/substrate-size/3-inch-wafer
[11] https://snfguide.stanford.edu/guide/substrate-size/4-inch-wafer
[12] https://snfguide.stanford.edu/snf/substrate-size/6-inch-wafer