EPI (CVD), Low Pressure (LP) CVD, Hydrogen (H2) Annealing, Doping, Plasma Enhanced (PE) CVD |
AMAT Centurion Epitaxial System epi2 |
Deposit epitaxial and polycrystalline silicon, germanium and silicon-germanium films.
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Clean |
SNF Cleanroom Paul G Allen L107 |
Low Pressure (LP) CVD |
Teos SiO2 Deposition Furnace teos2 |
Teos2 furnace allows LPCVD deposition of silicon dioxide, using tetraethyl orthosilicate (TEOS) which can provide a more conformal coating at lower temperature than tylanbpsg films. This is a six inch tube.
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Clean |
SNF Cleanroom Paul G Allen L107 |
Low Pressure (LP) CVD, Doping |
Thermco LTO Deposition Furnace thermcoLTO |
Silicon dioxide (SiO2) is deposited at between 300 and 450C (depending on needs... ie metals 300C), low pressure (~350 mtorr), from silane and oxygen with or without phosphine doping. Doped LTO is also called PSG, or phosphosilicate glass. The refractive index of the film depends on the phosphorous content, lower deposition rate. The refractive index is also influenced by the temperature of the deposition. (Six inch furnace)
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Flexible |
SNF Cleanroom Paul G Allen L107 |
Low Pressure (LP) CVD |
Thermco Nitride Deposition Furnace LPCVD thermconitride1 |
Silicon nitride (or nitride or Si3N4) is deposited at moderately high temperatures (~800C) and low pressure (~250 mtorr), using dichlorosilane (SiCl2H2) and ammonia (NH3).
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Clean |
SNF Cleanroom Paul G Allen L107 |
Low Pressure (LP) CVD, Doping |
ThermcoPoly1 thermcopoly1 |
Polycrystalline silicon is deposited at a low pressure (~500 mtorr) using silane (SiH4). Deposition temperature is ~620C for polysilicon and ~520C for amorphous silicon.
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Clean |
SNF Cleanroom Paul G Allen L107 |
Low Pressure (LP) CVD, Doping |
ThermcoPoly2 thermcopoly2 |
Same as ThermcoPoly1 but in the "flexible cleanliness" group.
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Flexible |
SNF Cleanroom Paul G Allen L107 |
Low Pressure (LP) CVD, Doping |
TylanBPSG tylanbpsg |
Silicon dioxide (SiO2) is deposited at between 300 and 450C (depending on needs... ie metals 300C), low pressure (~350 mtorr), from silane and oxygen with or without phosphine doping. Doped LTO is also called PSG, or phosphosilicate glass). The refractive index of the film depends on the phosphorous content, lower deposition rate. The refractive index is also influenced by the temperature of the deposition. The oxide deposition rate is mostly dependent on the temperature and is ~ 175A/min at 400C for 4 inch wafers (~200A/min for 3 inch wafers).
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Clean, Semiclean |
SNF Cleanroom Paul G Allen L107 |