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Characterization

Characterization is a broad term that is used to describe any method of analysis of properties of materials and devices. The various tools listed here will use different techniques to study a wide variety of properties.

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Equipment name & Badger ID Location Image Overview Link to Training
Sensofar S-neox
s-neox
SNF Cleanroom Paul G Allen L107
Sensofar S-neox

The S-neox system from Sensofar is a 3D optical profiler combining confocal, interferometry, and focus variation techniques in the same sensor head without any moving parts. It is ideal for...Read more

Sensofar S-neox Training
Sinton Lifetime Tester
sinton-lifetime-tester
SNF Exfab Paul G Allen 151 Ocean

Sinton lifetime tester WCT-100 is used to test minority carrier lifetime at a specified minority carrier density. Electrons are the usual minority carries in a p-doped semiconductor and holes are...Read more

Sinton Lifetime Tester Training
SPF Measurement Bench SNF SPF Paul G Allen 138 SPF SPF Measurement Bench Training
Tencor P2 Profilometer
p2
SNF Cleanroom Paul G Allen L107
The Tencor P2 Long Scan Profiler is a surface profiler that measures step heights. Pieces to 8 inch wafers Stepheight 500 Å to 80µm Scan length 0.01 mm to 210 mm. Stylus Radius 12.5 µm Read more Tencor P2 Profilometer Training
Woollam
woollam
SNF Cleanroom Paul G Allen L107

The Woollam tool uses ellipsometry to characterize thin films.  Ellipsometry detects the phase change in polarized light as it reflects from or transmits through samples.  The Woollam does not directly...Read more

Woollam Training
XPS: PHI VersaProbe 1
PHI_XPS_snl
SNSF McCullough 102
XPS: PHI Versaprobe 1
XPS provides elemental and chemical information about the surface region (first 1- 30 monolayers) of nearly any solid material. XPS is useful for determining the elemental composition on the surface...Read more XPS PHI VersaProbe Training
XPS: PHI VersaProbe 3 SNSF McCullough 102
XPS provides elemental and chemical information about the surface region (first 1- 30 monolayers) of nearly any solid material. XPS is useful for determining the elemental composition on the surface...Read more XPS PHI VersaProbe Training

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