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Characterization

Characterization is a broad term that is used to describe any method of analysis of properties of materials and devices. The various tools listed here will use different techniques to study a wide variety of properties.

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Equipment name & Badger ID Location Image Overview Link to Trainingsort descending
AFM-Asylum
afm-asylum
SNF Exfab Paul G Allen 151 Ocean
Asylum AFM

Asylum AFM MFP-3D is a fully-featured atomic force microscopy system. It can accommodate a variety of small-to-medium size samples that do not exceed ~5-6 mm in height. The microscope is...Read more

AFM-Asylum Training
Alphastep 500 Profilometer
alphastep
SNF Cleanroom Paul G Allen L107

The Tencor Alphastep 500 is a stylus-based surface profiler to measure step heights of surfaces. A stylus is placed in contact with, and then gently dragged along the surface of...Read more

Alphastep 500 Profilometer Training
Biologic SP-300
biologic
SNF Exfab Paul G Allen 155 Mavericks
Photo of Biologic Potentiostat

The Biologic Poteniostat can be used for: - Renewable energy sources - Fundamental electrochemistry - Sensors - Corrosion - Electrolysis/anodizing - Coatings Our system has - Ultra low current: range...Read more

Bio-Logic Potentiostat Training
Woollam
woollam
SNF Cleanroom Paul G Allen L107

The Woollam tool uses ellipsometry to characterize thin films.  Ellipsometry detects the phase change in polarized light as it reflects from or transmits through samples.  The Woollam does not directly...Read more

Woollam Training
Jasco UV-Vis-NIR
jasco-uv-vis-nir
SNF Exfab Paul G Allen 151 Ocean

(From the Jasco website)

The unique single monochromator design of the V-670 requires fewer mirrors to provide a higher throughput resulting in a better signal-to-noise ratio over the...Read more

Jasco UV-Vis-NIR Training
Malvern Dynamic Light Scattering (DLS) Zetasizer
malvern-dls
SNF Exfab Paul G Allen 155 Mavericks

The Malvern Zetasizer Nano ZSP uses light scattering to evaluate nanoparticle sizes from 0.3 nm to 10 um in diameter. This system is also equipped with the capability to evaluate...Read more

Malvern Dynamic Light Scattering (DLS) Zetasizer Training
micromanipulator6000 IV-CV probe station
micromanipulator6000
SNF Exfab Paul G Allen 151 Ocean

Micromanipulator6000

 

Micromanipulator6000 is a four-probe electrical test station. With a Keysight B1500A Semiconductor Device Analyzer, it is capable of both I-V and C-V measurements.

What the Tool CAN do...Read more

micromanipulator6000 IV-CV probe station Training
Nanospec 210XP
nanospec2
SNF Exfab Paul G Allen 104 Stinson

The Nanometrics Nanospec 210XP system uses non-contact, spectro-reflectometry (measurement of the intensity of reflective light as a function of incident wavelength) to determine the thickness of transparent films (up to...Read more

Nanospec Training
Prometrix Resistivity Mapping System
prometrix
SNF Cleanroom Paul G Allen L107

The Prometrix OmniMap Model RS35e Resistivity Mapping System collects and analyzes sheet resistance data on various conductive layers such as implants, diffusions, epi, metals and bulk substrates. The system provides...Read more

Prometrix Training
Sinton Lifetime Tester
sinton-lifetime-tester
SNF Exfab Paul G Allen 151 Ocean

Sinton lifetime tester WCT-100 is used to test minority carrier lifetime at a specified minority carrier density. Electrons are the usual minority carries in a p-doped semiconductor and holes are...Read more

Sinton Lifetime Tester Training
Tencor P2 Profilometer
p2
SNF Cleanroom Paul G Allen L107
The Tencor P2 Long Scan Profiler is a surface profiler that measures step heights. Pieces to 8 inch wafers Stepheight 500 Å to 80µm Scan length 0.01 mm to 210 mm. Stylus Radius 12.5 µm Read more Tencor P2 Profilometer Training
Sensofar S-neox
s-neox
SNF Cleanroom Paul G Allen L107
Sensofar S-neox

The S-neox system from Sensofar is a 3D optical profiler combining confocal, interferometry, and focus variation techniques in the same sensor head without any moving parts. It is ideal for...Read more

Sensofar S-neox Training
Flexus 2320 Stress Tester
stresstest
SNF Cleanroom Paul G Allen L107

The Flexus 2320 determines wafer curvature by measuring the angle of deflection of a laser beam off the surface of the substrate. Film stress is determined by comparing the change...Read more

Flexus 2320 Stress Tester Training
Digital Instruments AFM Nanoscope Dimension 3000
afm2
SNF Exfab Paul G Allen 104 Stinson

Digital Instruments AFM Nanoscope Dimension 3000: * Atomic Force and scanning tunneling scanning modes: contact, tapping, non-contact, liftmode, force modulation, lateral force microscopy, magnetic force microscopy, phase imaging, scanning capacitance,...Read more

Digital Instruments AFM Nanoscope Dimension 3000 Training
Bruker Dimension ICON AFM Dimension ICON is one of the most popular modern AFMs on the market, highly appreciated by industry and academics alike. It is Bruker’s flagship AFM instrument, compatible with all modes...Read more Bruker Dimension ICON AFM Training
Keyence Digital Microscope VHX-6000
keyence
SNF Exfab Paul G Allen 104 Stinson Keyence Training
Park XE-70
XE-70_snl
[Photo: Park AFM]
Scanning Probe Microscopy (SPM) generally refers to a set of surface characterization techniques that utilize micro-machined cantilever probes with sharp tips to scan the sample surface.  Since its inception in...Read more Park XE-70 Training
CytoViva HSI
cytoviva
SNF Exfab Paul G Allen 151 Ocean

The Cytoviva is a hyperspectral imaging instrument which allows spectral mapping of individual pixels on a microscope image.

The Cytoviva website has great information about the instrument including ...Read more

Cytoviva Training
Nanospec 3
nanospec3
SNF Cleanroom Paul G Allen L107

The Nanometrics Nanospec system uses non-contact, spectro-reflectometry (measurement of the intensity of reflective light as a function of incident wavelength) to determine the thickness of transparent films (up to two)...Read more

Nanospec 3 Training
LEI1500 Contactless Sheet Resistance Mapping
eddycurrent
SNF Exfab Paul G Allen 151 Ocean

The LEI1500 Eddy current system measures sheet conductance (mhos/square) as a proportional DC voltage, before and after moving the sample under the sensing coil with magnetic field. This allows contactless measurement of...Read more

LEI1500 Contactless Sheet Resistance Mapping Training

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