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Electron & Ion Microscopy

TEM and STEM provides analysis to the sub-nanometer scale.  Possible studies include crystallographic phase and orientation imaging, elemental and chemical information, and a variety of in situ testing capabilities (heating, cooling, biasing, cathodoluminesence, liquid and gas environment). While the sample preparation may be more complex than for SEM, and the analyses may be more time-intensive, TEM/STEM can reach resolutions that are inaccessible by other techniques.

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FEI Titan Environmental Transmission Electron Microscope (TEM)
The Stanford Nano Shared Facilities houses a state-of-the-art FEI 80-300 environmental (scanning) transmission electron microscope with the following capabilities: Accelerating voltages 80, 200 and 300 kV High brightness field emission...Read more Titan TEM Training