Skip to content Skip to navigation

Digital Instruments AFM Nanoscope Dimension 3000 (afm2)

Overview

Digital Instruments AFM Nanoscope Dimension 3000: * Atomic Force and scanning tunneling scanning modes: contact, tapping, non-contact, liftmode, force modulation, lateral force microscopy, magnetic force microscopy, phase imaging, scanning capacitance, lithography, electric force microscopy * Integrated top-view color video optics with motorized zoom and 1.5 m optical resolution * X-Y stage that provides substantially better positioning repeatability - 3m unidirectional and 4-6m bidirectional * Little or no sample preparation for increased productivity * Easily changes among all AFM/STM scanning modes/techniques without tools.

Cleanliness: 

Capabilities and Specifications

Process Temperature Range: 
Notes: 

Atomic Force Microscope. Step Profile

Lab Facility, Location, and Badger Information

Lab Organization: 
Badger Area: 
Badger ID: 
afm2

Training and Maintenance

Lab Facility: 
Training Charges: 
3.00 hours
Primary Trainer: 
Primary Maintenance: 
Backup Maintenance: 

Steps to become a tool user

  1. Become a member of SNF.
  1. Read the relevant operating procedures:
  2. Contact the primary trainer: .
Notes: 

AFM-nsil required